International Journal of Scientific and Research Publications

IJSRP, Volume 3, Issue 5, May 2013 Edition [ISSN 2250-3153]

Wavelet Signal Generation for Nonlinear Device Testing Applications
      S.Ananthi , K.Padmanabhan
Abstract: Testing using standard function generators for frequency response, pulse response is common. Oftentimes, certain nonlinear systems such as testing of saturable reactors, semiconductors of the p-n-p-n type as well as testing of avalanche conditions in power transistors need sharp rise and slow fall signals To this end, a PC based function generator where any kind of signal pattern such as the above, including wavelets could be realized with a very simple circuit, combined with a power OPAMP. Circuits of the above type could be tested using this set-up. The software is developed in Visual Basic.

Reference this Research Paper (copy & paste below code):

S.Ananthi , K.Padmanabhan (2018); Wavelet Signal Generation for Nonlinear Device Testing Applications; Int J Sci Res Publ 3(5) (ISSN: 2250-3153). http://www.ijsrp.org/research-paper-0513.php?rp=P171141
©️ Copyright 2011-2023 IJSRP - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.