IJSRP, Volume 4, Issue 8, August 2014 Edition [ISSN 2250-3153]
Bindu S, M S Suresh
Measurement of bulk resistance/resistivity of conducting polymers is very common and an important requirement. Conducting polymers are semiconductors and four probe measurements are needed to avoid errors due to contact resistance and spreading resistances. However, in a device it is convenient to make two probe measurements rather than four probe measurement. It has been shown here that the bulk resistance of a thick film can be measured in the presence of rectifying contacts, using two probe method by measuring the impedance of the film beyond a critical frequency. The metal-film contact has been modeled as a diode to explain the behavior.