Abstract:
One of the great challenges of Scanning Tunneling Microscopy (STM) is the production of atomically sharp tips. Tungsten tips in Scanning Probe Microscope (SPM) and Atomic Force Microscope (AFM) are used instead of platinum and iridium (Pt/Ir) tips due to their high quality factor, mechanical stability and produced at low cost.
Reference this Research Paper (copy & paste below code):
Ashfaq Ali, Naveed Ullah
(2020); Experimental Investigation of Reproducible Electrochemical Etching Technique of Tungsten Probe at Domestic level for SPM; International Journal of Scientific and Research Publications (IJSRP)
10(05) (ISSN: 2250-3153), DOI: http://dx.doi.org/10.29322/IJSRP.10.05.2020.p10199
