International Journal of Scientific and Research Publications

IJSRP, Volume 3, Issue 12, December 2013 Edition [ISSN 2250-3153]


Technostress in Relation to Job Satisfaction and Organisational Commitment among IT Professionals
      Rajesh Kumar, Roshan Lal, Yashu Bansal, Saran.K.Sharma
Abstract: This present study aims to find out the impact of technostress on job satisfaction and organizational commitment among IT professionals. For this purpose,Computer Hassles Scale (Hudiburg), Job Satisfaction Scale (Singh and Sharma, 1971), Organizational Commitment Scale (Dhar et al. 2001) is administered to sample of 80 IT professionals from IT park Chandigarh in age range of 20-30 years. Pearson product moment coefficient of correlation is used for statistical analysis of the results. Results clearly revealed that technostress is negatively correlated to job satisfaction and organizational commitment.

Reference this Research Paper (copy & paste below code):

Rajesh Kumar, Roshan Lal, Yashu Bansal, Saran.K.Sharma (2018); Technostress in Relation to Job Satisfaction and Organisational Commitment among IT Professionals; Int J Sci Res Publ 3(12) (ISSN: 2250-3153). http://www.ijsrp.org/research-paper-1213.php?rp=P242091
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