Abstract: With the continuous miniaturization of CMOS technologies, the upcoming challenges of soft errors and reliability are expected to escalate. In order to address these challenges and bolster circuit reliability, this research paper presents a novel approach involving the design of two interleaved Double-Adjacent-Error-Corrections (DAECs) for Error Detection and Correction (EDAC). The DAECs employ a combination of the Hsiao Code, a modified version of Hamming codes widely utilized in modern systems, and the Cyclic Redundancy Code (CRC). The CRC, a non-secure hash function, is adept at identifying unintentional alterations in digital data within computer networks. It functions by leveraging a generator polynomial as the divisor in a polynomial long division over a finite field, treating the input data as the dividend, and yielding the remainder as the result. Due to its ease of hardware implementation, CRCs are extensively employed.